Number of found documents: 483
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Spatially separated HOMO/LUMO at interface of polypyrrole physisorbed on oxidized nanodiamond facets
Matunová, Petra; Jirásek, Vít; Rezek, Bohuslav
2017 - English
Nanodiamond particles (NDs) have recently risen in popularity owing to their unique and perspective properties. Merging NDs with organic molecules, such as polypyrrole (PPy), into hybrid organic-semiconductor functional systems gives rise to potential applications in photovoltaics (PV), which is supported by prior experimentally observed charge transfer between bulk diamond and PPy. This work focuses on the most relevant (111) and (100) O-terminated ND facets with different coverage of surface terminating oxygens in ether, epoxide, ketone, and peroxide positions. We use density functional theory (DFT) computations employing B3LYP functional and 6-31G(d) basis set. Energetically the most favorable oxidized ND facets were further optimized with PPy in physisorbed configurations. Analysis of geometry, binding energy, HOMO-LUMO gap, and charge transfer was done on the relaxed PPy-ND structures. Multiple hydrogen bonds are formed between PPy amino groups and O atoms on ND surface. Keywords: diamond; naoparticules; polypyrrole; density functional theory; charge transfer Available at various institutes of the ASCR
Spatially separated HOMO/LUMO at interface of polypyrrole physisorbed on oxidized nanodiamond facets

Nanodiamond particles (NDs) have recently risen in popularity owing to their unique and perspective properties. Merging NDs with organic molecules, such as polypyrrole (PPy), into hybrid ...

Matunová, Petra; Jirásek, Vít; Rezek, Bohuslav
Fyzikální ústav, 2017

Preparing of the Chameleon coating by the Ion Jet Deposition method
Skocdopole, J.; Aversa, L.; Golan, Martin; Schenk, A.; Baldi, G.; Kratochvílová, Irena; Kalvoda, L.; Nozar, P.
2017 - English
Preparation of chameleon coatings using an Ionized Jet Deposition (IJD) technique is reported in the present paper. IJD is a new flexible method for thin film deposition developed by Noivion, Srl. The chameleon coatings are thin films characterised by a distinct change of their tribological properties according to the external conditions. The deposited films of SiC and TiN materials were examined by the Raman spectroscopy, SEM and XPS. The results of the Raman spectroscopy have proved an amorphous structure of SiC films. The data from XPS on TiN films have shown that the\nfilms are heavily oxidized, but also prove that the films are composed of TiN and pure Ti. The SEM provided information about the size of grains and particles constituting the deposited films, which is important for tribological properties of the films. Deposition of the chameleon coating is very complex problem and IJD could be ideal method for preparation of this coating.\n Keywords: Ion Jet Deposition; Chameleon coating; Raman spectroscopy; scanning electron microscope; X-ray photoelectron spectroscopy Available at various institutes of the ASCR
Preparing of the Chameleon coating by the Ion Jet Deposition method

Preparation of chameleon coatings using an Ionized Jet Deposition (IJD) technique is reported in the present paper. IJD is a new flexible method for thin film deposition developed by Noivion, Srl. The ...

Skocdopole, J.; Aversa, L.; Golan, Martin; Schenk, A.; Baldi, G.; Kratochvílová, Irena; Kalvoda, L.; Nozar, P.
Fyzikální ústav, 2017

Back electrode influence on opto-electronic properties of organic photovoltaic blend characterized by Kelvin probe force microscopy
Čermák, Jan; Miliaieva, Daria; Hoppe, H.; Rezek, Bohuslav
2017 - English
Organic photovoltaic (PV) system consisting of P3HT:PCBM blend layer was prepared with an aluminum (Al) back electrode. After the final thermal annealing the Al layer was partially removed. Kelvin Probe Force Microscopy (KPFM) was used to measure photovoltage response to illumination by a solar spectrum light as a function of time (up to 3 weeks). Comparison of the same KPFM measurement on the areas with and without Al revealed differences in both morphology and photovoltage response to illumination. The data are discussed with view to reducing degradation of organic PV devices.\n Keywords: organic photovoltaics; Kelvin probe force microscopy; degradation Available at various institutes of the ASCR
Back electrode influence on opto-electronic properties of organic photovoltaic blend characterized by Kelvin probe force microscopy

Organic photovoltaic (PV) system consisting of P3HT:PCBM blend layer was prepared with an aluminum (Al) back electrode. After the final thermal annealing the Al layer was partially removed. Kelvin ...

Čermák, Jan; Miliaieva, Daria; Hoppe, H.; Rezek, Bohuslav
Fyzikální ústav, 2017

Metodika použití nízkoteplotního plazmatu za účelem sterilizace ran
Dejneka, Alexandr; Kubinová, Šárka; Moravec, J.; Bezděk, D.
2016 - Czech
Cílem metodiky je řešení sterilizace kožního povrchu a ran ve veterinární medicíně pomocí aplikace nízkoteplotního plazmatu. Nízkoteplotní plazma (NTP) má nespecifické antimikrobiální účinky a lze jej bezpečně aplikovat na živé tkáně, aniž by došlo k jejich poškození. Metodika předkládá řešení sterilizace tkání a ran s potenciální bakteriální, plísňovou či kvasinkovou kontaminací. Metodu lze použít také k antimikrobiální dekontaminaci a podpoře hojení chronických a nehojících se ran. The main aim of the methodology is sterilization of skin surface and wounds in veterinary medicine based on low-temperature plasma. Low-temperature plasma has a non-specific antimicrobial effect and therefore can be safely applied to the living tissue without causing any damage. The methodology describes a solution for sterilization of tissues and wounds with bacterial, fungal or yeast contamination. The method can also be used for antimicrobial decontamination as well as for healing of chronic and non-healing wounds. Methodology presents solutions sterilization of tissues and wounds with potential bacterial, fungal or yeast contamination. The method can also be used for antimicrobial decontamination and promote healing of chronic and non-healing wounds. Keywords: low-temperature plasma; sterilize; the wound; skin surface Available at various institutes of the ASCR
Metodika použití nízkoteplotního plazmatu za účelem sterilizace ran

Cílem metodiky je řešení sterilizace kožního povrchu a ran ve veterinární medicíně pomocí aplikace nízkoteplotního plazmatu. Nízkoteplotní plazma (NTP) má nespecifické antimikrobiální účinky a lze jej ...

Dejneka, Alexandr; Kubinová, Šárka; Moravec, J.; Bezděk, D.
Fyzikální ústav, 2016

Příprava vzorků
Kopeček, Jaromír
2016 - Czech
Základní shrnutí metalografických a materiálografických postupů a technik pro přípravu vzorků pro mikrosvazkovou analýzu v SEM a příbuzné techniky. The basic summyry of metallography and materialography as it is exploited for SEM samples´ preparation and connected techniques. Keywords: SEM; metallography Available at various institutes of the ASCR
Příprava vzorků

Základní shrnutí metalografických a materiálografických postupů a technik pro přípravu vzorků pro mikrosvazkovou analýzu v SEM a příbuzné techniky....

Kopeček, Jaromír
Fyzikální ústav, 2016

Surface acoustic waves in the layered systems
Tarasenko, Alexander; Boháč, Petr; Jastrabík, Lubomír
2016 - English
The laser acoustic method was used for analysis of two layered systems: thin titanium and diamond like carbon films both deposited on silicon. The film and substrate parameters are determined by fitting the theoretical curve to the measured dispersion curve. The fit software seeks that set of the system parameters whose theoretical curve coincides the best with the experimental data. For the titanium film the best root-mean square deviation was 2.04 m/s with the relative error < O.I % and for the DLC system the corresponding value was 0.30 m/s (the relative error < O.O1 % ). Keywords: laser acoustic method; surface acoustic waves; layered systems; Ti films; diamond-like carbon films Available at various institutes of the ASCR
Surface acoustic waves in the layered systems

The laser acoustic method was used for analysis of two layered systems: thin titanium and diamond like carbon films both deposited on silicon. The film and substrate parameters are determined by ...

Tarasenko, Alexander; Boháč, Petr; Jastrabík, Lubomír
Fyzikální ústav, 2016

Structure and properties of DLC layers for industrial applications
Mates, Tomáš; Ledinský, Martin; Vetushka, Aliaksi; Pikna, Peter; Fejfar, Antonín; Marek, A.; Vyskočil, J.; Erichsen, J.; Dawah, P.
2016 - English
Diamond-like carbon (DLC) layers based on amorphous carbon are used for wide range of applications, mostly for mechanical protection of various industrial components. We examined DLC layers at micro- and nanoscale by two independent microscopic techniques: Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) with a good agreement. We compared DLC layers grown on steel substrate and Si wafer and found similarly structured clusters and a certain difference in the density of nucleation centres. The measurements of local mechanical properties by the AFM tip revealed that the Si wafer behaves as softer material compared to the growing DLC nanoclusters that also exhibit lower values in the map of the relative local friction coefficient. Finally, we observed changes in the Raman spectra of the DLC exposed to annealing at ambient conditions and found a gradual shift from the diamond phase to the graphite phase as a function of increasing temperature. Keywords: DLC; PACVD; AFM; SEM; Raman Available at various institutes of the ASCR
Structure and properties of DLC layers for industrial applications

Diamond-like carbon (DLC) layers based on amorphous carbon are used for wide range of applications, mostly for mechanical protection of various industrial components. We examined DLC layers at micro- ...

Mates, Tomáš; Ledinský, Martin; Vetushka, Aliaksi; Pikna, Peter; Fejfar, Antonín; Marek, A.; Vyskočil, J.; Erichsen, J.; Dawah, P.
Fyzikální ústav, 2016

Difrakce zpět rozptýlených elektronů
Kopeček, Jaromír
2016 - Czech
Nástin metody EBSD dokumentující použitelnost metody, typické úkoly a aplikace. Outline of the EBSD method, its use, tasks and typical applications. Keywords: EBSD method; SEM; microstructure Available at various institutes of the ASCR
Difrakce zpět rozptýlených elektronů

Nástin metody EBSD dokumentující použitelnost metody, typické úkoly a aplikace.


Outline of the EBSD method, its use, tasks and typical applications.

Kopeček, Jaromír
Fyzikální ústav, 2016

Příprava vzorků pro kalibraci zvětšení elektronových mikroskopů / 2016
Olejník, Kamil
2016 - Czech
Zabývali jsme se litografickou přípravou vzorků používaných pro kalibraci zvětšení elektronových mikroskopů.We have been working on lithographical preparation of specimens used for magnification calibration of electron microscopes. We have been working on lithographical preparation of specimens used for magnification calibration of electron microscopes.\n Keywords: electron microscope calibration; electron-beam lithography Available at various institutes of the ASCR
Příprava vzorků pro kalibraci zvětšení elektronových mikroskopů / 2016

Zabývali jsme se litografickou přípravou vzorků používaných pro kalibraci zvětšení elektronových mikroskopů.We have been working on lithographical preparation of specimens used for magnification ...

Olejník, Kamil
Fyzikální ústav, 2016

Aproximace Fourierových koeficientů difrakčních profilů
Čerňanský, Marian
2016 - Czech
Je podán stručný přehled aproximací, které se vyskytují ve Warrenově–Averbachově interpretaci Fourierových koeficientů difrakčních profilů. Je ukázáno, že jisté aproximace průběhu Fourierových koeficientů umožňují stanovit velikost krystalitů a mikrodeformací jen z jedné difrakční linie.\n\n Approximations in the Warren-Averbach interpretation of Fourier coeeficients of diffraction profiles are briefly summarized. It is shown, that certain approximations of a course of Fourier coefficients enable estimate of crystallite size and microstrain only from a single diffraction line. Keywords: line profile analysis; Fourier coefficients; crystallite size; microstrain Available at various institutes of the ASCR
Aproximace Fourierových koeficientů difrakčních profilů

Je podán stručný přehled aproximací, které se vyskytují ve Warrenově–Averbachově interpretaci Fourierových koeficientů difrakčních profilů. Je ukázáno, že jisté aproximace průběhu Fourierových ...

Čerňanský, Marian
Fyzikální ústav, 2016

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