Název:
Microscopic characterization of graphene material and electronic quality across neighbouring, differently oriented copper grains
Autoři:
Čermák, Jan ; Yamada, T. ; Ganzerová, Kristína ; Rezek, Bohuslav Typ dokumentu: Příspěvky z konference Konference/Akce: International Conference NANOCON /6./, Brno (CZ), 2014-11-05 / 2014-11-07
Rok:
2015
Jazyk:
eng
Abstrakt: We study graphene grown across the boundary of three such grains having bright, medium, and dark color in reflection. Raman micro-spectroscopy proves presence of mostly a monoor bi-layer graphene on all the grains. Yet intensity of Raman 2D band is grain-dependent: highest at the darkest grain and lowest at the brightest one. Contrary, conductive atomic force microscopy detects the highest conductivity at the brightest grain and the lowest current at the darkest grain. This is attributed to dominant electrical current path through graphene and underlying oxide thickness of which also depends on the type of copper grain. We correlate and discuss the results with view to better understanding of graphene growth and electronic properties on large area copper substrates.
Klíčová slova:
atomic force microscopy; chemical vapor deposition; electronic properties; graphene; Raman spectroscopy Číslo projektu: GBP108/12/G108 (CEP) Poskytovatel projektu: GA ČR Zdrojový dokument: NANOCON 2014 Conference Proceedings, ISBN 978-80-87294-53-6
Instituce: Fyzikální ústav AV ČR
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Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0238688